Combined analysis
(eBook)
Author
Published
London, UK : Hoboken, NJ : ISTE ; Wiley, 2010.
Format
eBook
ISBN
1118622642, 1118622715, 1299315550, 1848211988, 9781118622643, 9781118622711, 9781299315556, 9781848211988
Physical Desc
1 online resource (xviii, 497 pages) : illustrations
Status
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More Details
Language
English
Notes
Bibliography
Includes bibliographical references and index.
Description
This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
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Citations
APA Citation, 7th Edition (style guide)
Chateigner, D. (2010). Combined analysis . ISTE ; Wiley.
Chicago / Turabian - Author Date Citation, 17th Edition (style guide)Chateigner, Daniel. 2010. Combined Analysis. ISTE ; Wiley.
Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)Chateigner, Daniel. Combined Analysis ISTE ; Wiley, 2010.
MLA Citation, 9th Edition (style guide)Chateigner, Daniel. Combined Analysis ISTE ; Wiley, 2010.
Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.
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Grouped Work ID
c0f501ed-0c29-4547-9e2b-d9623a081f2a-eng
Grouping Information
| Grouped Work ID | c0f501ed-0c29-4547-9e2b-d9623a081f2a-eng |
|---|---|
| Full title | combined analysis |
| Author | chateigner daniel |
| Grouping Category | book |
| Last Update | 2024-10-04 13:10:14PM |
| Last Indexed | 2024-10-05 06:26:04AM |
Marc Record
| First Detected | Jul 29, 2024 03:59:48 PM |
|---|---|
| Last File Modification Time | Oct 04, 2024 01:17:39 PM |
MARC Record
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| 100 | 1 | |a Chateigner, Daniel.|0 http://id.loc.gov/authorities/names/n2010024008 | |
| 245 | 1 | 0 | |a Combined analysis /|c Daniel Chateigner. |
| 260 | |a London, UK :|b ISTE ;|a Hoboken, NJ :|b Wiley,|c 2010. | ||
| 300 | |a 1 online resource (xviii, 497 pages) :|b illustrations | ||
| 336 | |a text|b txt|2 rdacontent | ||
| 337 | |a computer|b c|2 rdamedia | ||
| 338 | |a online resource|b cr|2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters | |
| 505 | 8 | |a 1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards | |
| 505 | 8 | |a 1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength | |
| 505 | 8 | |a 2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures | |
| 505 | 8 | |a Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF) | |
| 520 | |a This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Analytical chemistry.|0 http://id.loc.gov/authorities/subjects/sh85023011 | |
| 650 | 0 | |a Solid state chemistry.|0 http://id.loc.gov/authorities/subjects/sh85124636 | |
| 650 | 0 | |a Crystals.|0 http://id.loc.gov/authorities/subjects/sh85034503 | |
| 758 | |i has work:|a Combined analysis (Text)|1 https://id.oclc.org/worldcat/entity/E39PCH9g4KHtYdkpWdWggm87gX|4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version:|z 1848211988|w (DLC) 2010012973 |
| 856 | 4 | 0 | |u https://www.aclib.us/OReilly |